发明名称 Error compensation in three-dimensional mapping
摘要 A method for forming a three-dimensional (3D) map of an object, including illuminating the object from a light source so as to project a pattern onto the object, capturing an image of the pattern using an array of detector elements, and processing the captured image so as to measure respective offsets of elements of the pattern in the captured image relative to a reference pattern, the offsets including at least a first offset of a first element of the pattern and a second offset of a second element of the pattern, measured respectively in first and second, mutually-perpendicular directions in a plane of the array. The method further includes computing a correction factor in response to the first offset, applying the correction factor to the second offset so as to find a corrected offset, and computing depth coordinates of the object in response to the corrected offset.
申请公布号 US9330324(B2) 申请公布日期 2016.05.03
申请号 US201213541775 申请日期 2012.07.05
申请人 APPLE INC. 发明人 Cohen Daniel;Rais Dmitri;Sali Erez;Galezer Niv;Shpunt Alexander
分类号 H04N5/228;G01B11/30;G06K9/20;G06T7/00;H04N13/02 主分类号 H04N5/228
代理机构 D. Kligler IP Services Ltd. 代理人 D. Kligler IP Services Ltd.
主权项 1. A method for forming a three-dimensional (3D) map of an object, comprising: illuminating the object from a light source so as to project a pattern onto the object; capturing an image of the pattern on the object using an array of detector elements; processing the captured image so as to measure respective offsets of elements of the pattern in the captured image relative to a reference pattern, the offsets comprising at least a first offset of a first element of the pattern and a second offset of a second element of the pattern, measured respectively in first and second, mutually-perpendicular directions in a plane of the array; computing a geometrical correction factor in response to the first offset; applying the geometrical correction factor to the second offset so as to find a corrected offset; and computing depth coordinates of the object in response to the corrected offset.
地址 Cupertino CA US