发明名称 |
VAPOR PHASE GROWTH APPARATUS AND VAPOR PHASE GROWTH METHOD |
摘要 |
A vapor phase growth apparatus according to an embodiment includes n (n is an integer equal to or greater than 1) reaction chambers each processing a substrate under a pressure less than atmospheric pressure, a cassette chamber having a cassette holding portion capable of placing a cassette holding the substrate on the cassette holding portion, internal pressure of the cassette chamber being able to be reduced to a pressure less than the atmospheric pressure, a transferring chamber provided between the reaction chamber and the cassette chamber and transferring the substrate under a pressure less than the atmospheric pressure, and a substrate standby portion capable of simultaneously holding n or more substrates processed in the reaction chamber and provided in a region having a heat-resistant temperature of 500° C. or more, internal pressure of the region being able to be reduced to a pressure less than the atmospheric pressure. |
申请公布号 |
US2016115622(A1) |
申请公布日期 |
2016.04.28 |
申请号 |
US201514921159 |
申请日期 |
2015.10.23 |
申请人 |
NuFlare Technology, Inc. |
发明人 |
ITO Hideki;SATO Yuusuke |
分类号 |
C30B25/02;C30B25/12 |
主分类号 |
C30B25/02 |
代理机构 |
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代理人 |
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主权项 |
1. A vapor phase growth apparatus comprising:
n (n is an integer equal to or greater than 1) reaction chambers each processing a substrate under a pressure less than atmospheric pressure; a cassette chamber having a cassette holding portion capable of placing a cassette holding the substrate on the cassette holding portion, internal pressure of the cassette chamber being able to be reduced to a pressure less than the atmospheric pressure; a transferring chamber provided between the reaction chamber and the cassette chamber, the transferring chamber configured to transfer the substrate under a pressure less than the atmospheric pressure; and a substrate standby portion capable of simultaneously holding n or more substrates processed in the reaction chamber and provided in a region having a heat-resistant temperature of 500° C. or more, internal pressure of the region being able to be reduced to a pressure less than the atmospheric pressure. |
地址 |
Kanagawa JP |