发明名称 Memory Cells, Methods of Forming Memory Cells, and Methods of Programming Memory Cells
摘要 Some embodiments include methods in which a memory cell is formed to have programmable material between first and second access lines, with the programmable material having two compositionally different regions. A concentration of ions and/or ion-vacancies may be altered in at least one of the regions to change a memory state of the memory cell and to simultaneously form a pn diode. Some embodiments include memory cells having programmable material with two compositionally different regions, and having ions and/or ion-vacancies diffusible into at least one of the regions. The memory cell has a memory state in which the first and second regions are of opposite conductivity type relative to one another.
申请公布号 US2016118118(A1) 申请公布日期 2016.04.28
申请号 US201514982810 申请日期 2015.12.29
申请人 Micron Technology, Inc. 发明人 Liu Jun;Sandhu Gurtej S.
分类号 G11C13/00;H01L27/24;H01L45/00 主分类号 G11C13/00
代理机构 代理人
主权项
地址 Boise ID US