发明名称 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a fine shape, and to provide a transistor with a small channel length.SOLUTION: A method of manufacturing a semiconductor device includes: forming a semiconductor on a substrate; depositing a first conductor on the semiconductor; depositing a first insulator on the first conductor; depositing a resist on the first insulator; exposing and developing the resist to expose a part of the first insulator while leaving a second region and a third region; applying a bias in a direction vertical to an upper surface of the substrate; generating plasma by a gas containing carbon and halogen; and depositing an organic compound and etching the organic compound, by the plasma. With respect to the organic compound, an etching rate is higher than a deposition rate at an exposed part of the first insulator, and the deposition rate is higher than the etching rate at a lateral face of the second region.SELECTED DRAWING: Figure 1
申请公布号 JP2016066793(A) 申请公布日期 2016.04.28
申请号 JP20150183912 申请日期 2015.09.17
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 SASAGAWA SHINYA;SHIMOMURA AKIHISA;TOCHIBAYASHI KATSUAKI;ENDO YUTA;YAMAZAKI SHUNPEI
分类号 H01L21/336;H01L21/28;H01L21/3065;H01L21/363;H01L21/8234;H01L21/8238;H01L21/8242;H01L21/8247;H01L27/088;H01L27/092;H01L27/108;H01L27/115;H01L27/146;H01L29/417;H01L29/423;H01L29/49;H01L29/786;H01L29/788;H01L29/792 主分类号 H01L21/336
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