发明名称 配線構造及びその製造方法並びに電子装置及びその製造方法
摘要 PROBLEM TO BE SOLVED: To provide a wiring structure having high reliability and a manufacturing method thereof, and also to provide an electronic device having the wiring structure and a manufacturing method thereof.SOLUTION: A wiring structure includes: a first insulation resin layer 17 formed on a base material 10; a wiring 22 formed in a groove 18 formed in the first insulation resin layer; and a second insulation resin layer 24 formed in the groove so as to cover the upper surface of the wiring and capturing wiring constituent atoms diffused from the wiring.
申请公布号 JP5910151(B2) 申请公布日期 2016.04.27
申请号 JP20120034251 申请日期 2012.02.20
申请人 富士通株式会社 发明人 神吉 剛司;池田 淳也;中田 義弘
分类号 H05K3/10;H01L23/12;H05K3/22;H05K3/46 主分类号 H05K3/10
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