发明名称 POLISHING COMPOSITION AND METHOD FOR POLISHING COBALT FILM
摘要 PROBLEM TO BE SOLVED: To provide a polishing composition which enables the polishing of a Co film in a semiconductor substrate that includes many films including cobalt (Co), a metal, a metal oxide and a dielectric.SOLUTION: A polishing composition comprises: a polishing material; a weak acid working as a removal rate-enhancement agent (RRE); a pH adjuster; and an azole-containing corrosion inhibitor (CI). The RRE, pH adjuster and CI each have a value of pKa (1(pKa)<pKa<18(pKa)) within a range of 1-18. The pKa values of the respective constituents are associated with each other by the polishing composition/slurry pH(pH), and the following formula: pKa+6<pH<pKa-6. The polishing composition has about less than 100 ppm (parts per million) of sulfuric acid ions and about less than 100 ppm of halide ions, and acts in a range of pH7-pH12.SELECTED DRAWING: None
申请公布号 JP2016058730(A) 申请公布日期 2016.04.21
申请号 JP20150174310 申请日期 2015.09.04
申请人 FUJIFILM PLANAR SOLUTIONS LLC 发明人 WANG LULING;ABHUDAYA MISHRA;DEEPAK MAHULIKAR;RICHARD WEN
分类号 H01L21/304;B24B37/00;C09K3/14 主分类号 H01L21/304
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