发明名称 WAFER POLISHING APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide a wafer polishing apparatus capable of improving polishing flatness of front surfaces, rear surfaces and edge portions of wafers.SOLUTION: An embodiment includes a lower surface plate, an upper surface plate disposed over the lower surface plate, a carrier disposed between the lower surface plate and the upper surface plate and containing a wafer, and a lift unit either lifting the carrier such that an upper surface of the carrier contacts a lower surface of the upper surface plate or lowering the carrier such that a lower surface of the carrier contacts an upper surface of the lower surface plate.SELECTED DRAWING: Figure 1
申请公布号 JP2016055421(A) 申请公布日期 2016.04.21
申请号 JP20150151599 申请日期 2015.07.31
申请人 LG SILTRON INC 发明人 HAN KEE YUN
分类号 B24B37/07 主分类号 B24B37/07
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