发明名称 Debonding Schemes
摘要 A method includes receiving a wafer stack having at least two wafers bonded together. At least one blade is inserted between a first wafer of the at least two wafers and a second wafer of the at least two wafers. The blade has a channel configured to inject air or fluid. The first wafer is debonded from the second wafer using the at least one blade. In another embodiment, a detacher having a convex bottom surface is attached to the wafer stack. The first wafer is debonded from the second wafer using the detacher.
申请公布号 US2016111316(A1) 申请公布日期 2016.04.21
申请号 US201414517569 申请日期 2014.10.17
申请人 Taiwan Semiconductor Manufacturing Company, Ltd. 发明人 Huang Xin-Hua;Liu Ping-Yin;Lin Hung-Hua;Chao Lan-Lin;Tsai Chia-Shiung
分类号 H01L21/683;H01L23/00 主分类号 H01L21/683
代理机构 代理人
主权项 1. A method, comprising: receiving a wafer stack having at least two wafers bonded together; inserting at least one blade between a first wafer of the at least two wafers and a second wafer of the at least two wafers, wherein the at least one blade has a channel configured to inject air or fluid; and separating the first wafer from the second wafer using the at least one blade.
地址 Hsin-Chu TW