发明名称 Automated analyzer and maintenance method for same
摘要 An automated analyzer includes a conveyance mechanism to convey a specimen, an analysis portion to analyze the specimen, and a device cover to cover a movable mechanism including the conveyance mechanism. The automated analyzer is provided with an interlock mechanism and an interlock release mechanism. The interlock mechanism stops an operation of the movable mechanism when the device cover is opened. The interlock release mechanism disables all or part of the interlock mechanism. The interlock mechanism is enabled when a lever 301 is in contact with a safety switch 302. The interlock mechanism is disabled or partially disabled when the lever 301 is not in contact with the safety switch 302. This enables to prevent a user from inadvertently touching the movable mechanism including a hazard region during analysis of the automated analyzer or a maintenance task. Only a specific maintenance task can be performed with the device cover opened.
申请公布号 US9316662(B2) 申请公布日期 2016.04.19
申请号 US201214239624 申请日期 2012.08.06
申请人 HITACHI HIGH-TECHNOLOGIES CORPORATION 发明人 Ishigami Ryohei;Orihashi Toshihide;Yoshida Goro;Nishigaki Kenichi;Yanami Hideyuki
分类号 G01N35/04;G01N21/78;G01N35/10;G01N21/25;G01N35/00 主分类号 G01N35/04
代理机构 Mattingly & Malur, PC 代理人 Mattingly & Malur, PC
主权项 1. An automated analyzer comprising: a conveyance mechanism to convey a specimen; an analysis portion to analyze the specimen; a device cover to cover a movable mechanism including the conveyance mechanism; an interlock mechanism to stop an operation of the movable mechanism when the device cover is opened; and an interlock release mechanism to disable all or part of the interlock mechanism, wherein the interlock release mechanism disables the interlock mechanism to enable the operation of the movable mechanism with the device cover opened, and makes a specific maintenance task available which is otherwise disabled by the interlock mechanism.
地址 Tokyo JP