发明名称 WORKPIECE PROCESSING METHOD
摘要 The present invention relates to a method for processing an object to be treated, capable of adjusting an opening width of a mask by forming a siliconoxide film at low temperatures without an exclusive film deposition device. The method for processing an object to be treated can form a siliconoxide film by repeating a sequence which includes: a first process (a) of forming a responsive precursor by generating a first gaseous plasma including silicon halogenide in a process container of the plasma process device accommodating an object to be processed; a second process (b) of purging a space in the process container; a third process (c) of forming a siliconoxide film by generating a gaseous plasma including oxygen gas in the process container; and a fourth process (d) of purging a space in the process container.
申请公布号 KR20160041764(A) 申请公布日期 2016.04.18
申请号 KR20150134479 申请日期 2015.09.23
申请人 TOKYO ELECTRON LIMITED 发明人 KIHARA YOSHIHIDE;HISAMATSU TORU;HONDA MASANOBU
分类号 H01L21/033;H01L21/02;H01L21/321 主分类号 H01L21/033
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