发明名称 |
WORKPIECE PROCESSING METHOD |
摘要 |
The present invention relates to a method for processing an object to be treated, capable of adjusting an opening width of a mask by forming a siliconoxide film at low temperatures without an exclusive film deposition device. The method for processing an object to be treated can form a siliconoxide film by repeating a sequence which includes: a first process (a) of forming a responsive precursor by generating a first gaseous plasma including silicon halogenide in a process container of the plasma process device accommodating an object to be processed; a second process (b) of purging a space in the process container; a third process (c) of forming a siliconoxide film by generating a gaseous plasma including oxygen gas in the process container; and a fourth process (d) of purging a space in the process container. |
申请公布号 |
KR20160041764(A) |
申请公布日期 |
2016.04.18 |
申请号 |
KR20150134479 |
申请日期 |
2015.09.23 |
申请人 |
TOKYO ELECTRON LIMITED |
发明人 |
KIHARA YOSHIHIDE;HISAMATSU TORU;HONDA MASANOBU |
分类号 |
H01L21/033;H01L21/02;H01L21/321 |
主分类号 |
H01L21/033 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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