发明名称 Abnormality detection system
摘要 The abnormality detection system is provided for detecting an abnormality of an object. The abnormality detection system includes a high-frequency power source, a primary coil, a secondary coil and a controller. The high-frequency power source supplies power. The primary coil receives the power supplied from the high-frequency power source. The secondary coil is mounted to the object in noncontact with the primary coil for receiving power supplied from the primary coil. The controller is operable to detect the power received by the secondary coil and also to determine whether or not an abnormality is present in the object based on the detected power.
申请公布号 EP2412560(A3) 申请公布日期 2016.04.13
申请号 EP20110175297 申请日期 2011.07.26
申请人 KABUSHIKI KAISHA TOYOTA JIDOSHOKKI 发明人 TAGUCHI, YUICHI;KOIKE, TSUYOSHI;YAMAGUCHI, ATSUSHI
分类号 B60L11/18;B60L3/00;B60L5/00;B60M7/00;H01M10/44;H02J7/00;H02J7/02;H02J17/00 主分类号 B60L11/18
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