发明名称 |
Semiconductor device |
摘要 |
A semiconductor device including a semiconductor substrate having a first surface and a second surface, the first surface being configured for formation of a semiconductor element; a through hole extending through the semiconductor substrate; and a through electrode disposed in the through hole. The through electrode includes an insulating film disposed along a sidewall of the through hole, a conductive layer comprising a first material disposed along the insulating film, and an electrode layer comprising a second material filled inside the through hole over the conductive layer. The first material is softer than the second material. The second material has a melting point higher than a melting point of the first material. The electrode layer includes a void portion being closed near the second surface of the semiconductor substrate. |
申请公布号 |
US9312207(B2) |
申请公布日期 |
2016.04.12 |
申请号 |
US201414484400 |
申请日期 |
2014.09.12 |
申请人 |
KABUSHIKI KAISHA TOSHIBA |
发明人 |
Wakatsuki Satoshi;Sakata Atsuko;Uchida Kengo;Higashi Kazuyuki;Endo Mitsuyoshi |
分类号 |
H01L23/48;H01L23/00 |
主分类号 |
H01L23/48 |
代理机构 |
Finnegan, Henderson, Farabow, Garrett & Dunner, LLP |
代理人 |
Finnegan, Henderson, Farabow, Garrett & Dunner, LLP |
主权项 |
1. A semiconductor device comprising:
a semiconductor substrate having a first surface and a second surface, the first surface being configured for formation of a semiconductor element; a wiring pattern formed along the first surface; a through hole extending through the semiconductor substrate and reaching a portion of the wiring pattern; and a through electrode disposed in the through hole and connected to the wiring pattern at the first surface, the through electrode including an insulating film disposed along a sidewall of the through hole, a conductive layer comprising a titanium film disposed along the insulating film and a copper film disposed along a surface of the titanium film, and an electrode layer comprising a nickel film filled inside the through hole over the conductive layer, the conductive layer being softer than the electrode layer, the electrode layer having a melting point higher than a melting point of the conductive layer, and the electrode layer including a void portion enclosed therein and having an end portion disposed near the second surface of the semiconductor substrate. |
地址 |
Tokyo JP |