发明名称 |
Chemical mechanical polishing method and apparatus |
摘要 |
Methods for polishing a semiconductor wafer using a pad resurfacing arm and an apparatus therefor are disclosed. Embodiments may include providing a semiconductor wafer on a chemical mechanical polishing (CMP) tool, the CMP tool including a polish pad and a pad resurfacing arm which includes a pad cleaning part, a pad conditioning part, and a slurry dispensing part, dispensing a slurry to the polish pad utilizing the pad resurfacing arm, and polishing the semiconductor wafer utilizing the polish pad. |
申请公布号 |
US9312142(B2) |
申请公布日期 |
2016.04.12 |
申请号 |
US201414300705 |
申请日期 |
2014.06.10 |
申请人 |
GLOBALFOUNDRIES INC. |
发明人 |
Kramer Jens |
分类号 |
H01L21/306;B24B53/017;H01L21/67 |
主分类号 |
H01L21/306 |
代理机构 |
Ditthavong & Steiner, P.C. |
代理人 |
Ditthavong & Steiner, P.C. |
主权项 |
1. A method comprising:
providing a semiconductor wafer on a chemical mechanical polishing (CMP) tool, the CMP tool comprising:
a polish pad, anda pad resurfacing arm having a cylindrical or conical shape with a length extending from an outer periphery of the polish pad and across a center of the polish pad, the pad resurfacing arm comprising:
a pad cleaning part,a pad conditioning part, anda slurry dispensing part; dispensing a slurry to the polish pad utilizing the pad resurfacing arm; and polishing the semiconductor wafer utilizing the polish pad by rotating the pad resurfacing arm. |
地址 |
Grand Cayman KY |