发明名称 Chemical mechanical polishing method and apparatus
摘要 Methods for polishing a semiconductor wafer using a pad resurfacing arm and an apparatus therefor are disclosed. Embodiments may include providing a semiconductor wafer on a chemical mechanical polishing (CMP) tool, the CMP tool including a polish pad and a pad resurfacing arm which includes a pad cleaning part, a pad conditioning part, and a slurry dispensing part, dispensing a slurry to the polish pad utilizing the pad resurfacing arm, and polishing the semiconductor wafer utilizing the polish pad.
申请公布号 US9312142(B2) 申请公布日期 2016.04.12
申请号 US201414300705 申请日期 2014.06.10
申请人 GLOBALFOUNDRIES INC. 发明人 Kramer Jens
分类号 H01L21/306;B24B53/017;H01L21/67 主分类号 H01L21/306
代理机构 Ditthavong & Steiner, P.C. 代理人 Ditthavong & Steiner, P.C.
主权项 1. A method comprising: providing a semiconductor wafer on a chemical mechanical polishing (CMP) tool, the CMP tool comprising: a polish pad, anda pad resurfacing arm having a cylindrical or conical shape with a length extending from an outer periphery of the polish pad and across a center of the polish pad, the pad resurfacing arm comprising: a pad cleaning part,a pad conditioning part, anda slurry dispensing part; dispensing a slurry to the polish pad utilizing the pad resurfacing arm; and polishing the semiconductor wafer utilizing the polish pad by rotating the pad resurfacing arm.
地址 Grand Cayman KY