发明名称 AUTOMATIC SAMPLE PIECE MANUFACTURING APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide an apparatus for automatizing an operation for extracting and transferring into a sample piece holder, a sample piece formed by processing of a sample by an ion beam.SOLUTION: An automatic sample piece manufacturing apparatus 10 includes a computer 21 for controlling charged particle beam irradiation optical systems 14, 15 and sample piece transfer means so that a template of a columnar part is produced based on a columnar image acquired by irradiation of a charged particle beam, and that the sample piece is transferred to the columnar part based on positional information obtained by template matching using the template.SELECTED DRAWING: Figure 1
申请公布号 JP2016050853(A) 申请公布日期 2016.04.11
申请号 JP20140176239 申请日期 2014.08.29
申请人 HITACHI HIGH-TECH SCIENCE CORP 发明人 YAMAMOTO HIROSHI;UEMOTO ATSUSHI;ASAHATA TATSUYA;SATO MAKOTO
分类号 G01N1/28;H01J37/20;H01J37/22 主分类号 G01N1/28
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