发明名称 |
AUTOMATIC SAMPLE PIECE MANUFACTURING APPARATUS |
摘要 |
PROBLEM TO BE SOLVED: To provide an apparatus for automatizing an operation for extracting and transferring into a sample piece holder, a sample piece formed by processing of a sample by an ion beam.SOLUTION: An automatic sample piece manufacturing apparatus 10 includes a computer 21 for controlling charged particle beam irradiation optical systems 14, 15 and sample piece transfer means so that a template of a columnar part is produced based on a columnar image acquired by irradiation of a charged particle beam, and that the sample piece is transferred to the columnar part based on positional information obtained by template matching using the template.SELECTED DRAWING: Figure 1 |
申请公布号 |
JP2016050853(A) |
申请公布日期 |
2016.04.11 |
申请号 |
JP20140176239 |
申请日期 |
2014.08.29 |
申请人 |
HITACHI HIGH-TECH SCIENCE CORP |
发明人 |
YAMAMOTO HIROSHI;UEMOTO ATSUSHI;ASAHATA TATSUYA;SATO MAKOTO |
分类号 |
G01N1/28;H01J37/20;H01J37/22 |
主分类号 |
G01N1/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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