发明名称 |
TECHNIQUES FOR DATA RETENTION IN MEMORY CELLS DURING POWER INTERRUPTION |
摘要 |
Volatile memory is described, comprising: (i) a first inverter comprising a first p-type field effect transistor (FET) connected to a first n-type FET; (ii) a second inverter comprising a second p-type FET connected to a second n-type FET; (iii) a third p-type FET; (iv) a fourth p-type FET; and (v) a floating line connecting (i) a source of the third p-type FET, and (ii) a source of the fourth p-type FET, wherein: (a) the first data line is connected to: a gate of the second p-type FET, a gate of the second n-type FET, a drain of the third p-type FET, and a gate of the fourth p-type FET, and (b) the second data line is connected to: a gate of the first p-type FET, a gate of the first n-type FET, a drain of the fourth p-type FET, and a gate of the third p-type FET. |
申请公布号 |
US2016099046(A1) |
申请公布日期 |
2016.04.07 |
申请号 |
US201514965362 |
申请日期 |
2015.12.10 |
申请人 |
NANO-RETINA, INC. |
发明人 |
LIRAN Tuvia |
分类号 |
G11C11/417;A61F2/14;H01L27/11 |
主分类号 |
G11C11/417 |
代理机构 |
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代理人 |
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主权项 |
1. Apparatus comprising a volatile memory, the volatile memory having a first data line and a second data line, and comprising:
a first inverter comprising a first p-type field effect transistor (FET) connected to a first n-type FET; a second inverter comprising a second p-type FET connected to a second n-type FET, and cross-coupled with the first inverter; a third p-type FET; a fourth p-type FET; and a floating line connecting (i) a source of the third p-type FET, and (ii) a source of the fourth p-type FET,wherein:
the first data line is connected to:
a gate of the second p-type FET,a gate of the second n-type FET,a drain of the third p-type FET, anda gate of the fourth p-type FET, and the second data line is connected to:
a gate of the first p-type FET,a gate of the first n-type FET,a drain of the fourth p-type FET, anda gate of the third p-type FET. |
地址 |
Wilmington DE US |