发明名称 METHOD FOR WEAR LEVELING IN A NONVOLATILE MEMORY
摘要 A method for writing and reading data in memory cells, comprising, when writing a data in a block of a first memory zone, a step consisting of writing in a second memory zone a temporary information structure metadata comprising a start flag, an identifier of the temporary information structure, an information about the location of the block in the first memory zone, and a final flag, and, after a power on of the first memory zone, searching for an anomaly in temporary information structures present in the second memory zone.
申请公布号 US2016098220(A1) 申请公布日期 2016.04.07
申请号 US201514955511 申请日期 2015.12.01
申请人 STMicroelectronics (Rousset) SAS 发明人 Rousseau Hubert
分类号 G06F3/06 主分类号 G06F3/06
代理机构 代理人
主权项 1. A method of writing and reading data in electrically erasable and programmable nonvolatile memory cells, the method comprising: writing data in a block of a first nonvolatile memory zone that is programmable by block; in conjunction with the writing the data in the block of the first nonvolatile memory zone, writing in a second nonvolatile memory zone containing metadata associated with data in the first nonvolatile memory zone, metadata associated with the writing of the data in the block, the metadata being written in a temporary information structure associated with the writing of the data in the block, wherein the temporary information structure associated with the writing of the data in the block includes: a start flag;an identifier of the temporary information structure;an information about a location of the block in the first nonvolatile memory zone, wherein the information included in the temporary information structure about the location of the block in the first nonvolatile memory zone includes information about a location in the second nonvolatile memory zone of a metadata structure associated with a block to program in the first nonvolatile memory zone; anda final flag; and in conjunction with a power-on of the first nonvolatile memory zone, searching for an anomaly in temporary information structures present in the second nonvolatile memory zone.
地址 Rousset FR