Electrical test apparatus for a photovoltaic component

摘要

The present invention relates to electrical test apparatuses for photovoltaic components and methods of testing photovoltaic components.

主权项

1. An electrical test apparatus for testing a photovoltaic component, comprising:
an enclosure comprising a lid configured to be placed in an open position and a closed position and wherein the closed position applies force to the photovoltaic component positioned within the enclosure; a first conducting layer disposed within the enclosure; and a second conducting layer attached to the lid and disposed within the enclosure at least when the lid is in the closed position; wherein when the lid is in the closed position and electrical power is applied to the photovoltaic component positioned between and in contact with the first and second conducting layers, the first and second conducting layers are configured to conduct any leakage current from the photovoltaic component to a current measuring device.