发明名称 Resistance change type memory
摘要 According to one embodiment, a resistance change type memory includes a first and a second bit lines, a memory cell connected between the first and second bit lines and including a variable resistance element as a memory element and a first select element including a first control terminal connected to a word line, and an auxiliary circuit connected to the first bit line and including a second select element including a second control terminal connected to a control line. When data is read from the memory cell, a first current in a read current supplied to the first bit line is supplied to the memory element and the first select element, and a second current in the read current is supplied to the second select element.
申请公布号 US9305627(B2) 申请公布日期 2016.04.05
申请号 US201514739047 申请日期 2015.06.15
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 Hatsuda Kosuke
分类号 G11C11/16;G11C13/00 主分类号 G11C11/16
代理机构 Holtz, Holtz & Volek PC 代理人 Holtz, Holtz & Volek PC
主权项 1. A resistance change type memory comprising: a first bit line and a second bit line extending in a first direction; a first word line extending in a second direction; a control line extending in the second direction; a memory cell connected between the first and second bit lines and including a variable resistance element as a memory element and a first select element including a first control terminal connected to the first word line; and a circuit connected to the first bit line and including a second select element, the second select element including a second control terminal connected to the control line, wherein one end of the second select element is connected to a ground line, wherein, when reading data from the memory cell, a read current is supplied to the first bit line, the memory cell and the circuit are turned on, a first current included in the read current is supplied to the memory element and the first select element, and a second current included in the read current is supplied to the second select element.
地址 Tokyo JP