发明名称 Multilayer ceramic electronic device
摘要 A multilayer ceramic electronic device comprising a lamination in which an internal electrode layer 3 and a dielectric layer 2 are laminated alternatively, wherein the dielectric layer 2 is comprised of a dielectric ceramic composition including a main component represented by a general formula of ABO3 and a rare-earth component R, and segregation phases 5 including the rare-earth component R are present in the dielectric layer 2. When the dielectric layer 2 is separated to six areas by dividing the dielectric layer 2 sandwiched by a pair of the internal dielectric layers 3 in the thickness direction, there are the R segregation phases present in two neighboring areas 2a respectively adjacent to the pair of the internal electrode layers 3 in the dielectric layer 3 at a ratio of double or more compared with the R segregation phases present in two central areas 2b located at a substantially center in the dielectric layer 2.
申请公布号 US9305708(B2) 申请公布日期 2016.04.05
申请号 US201414445894 申请日期 2014.07.29
申请人 TDK CORPORATION 发明人 Kai Nobutaka;Okui Yasuhiro;Kindaichi Satoru;Kaneko Hideki;Kojima Tatsuya;Yoshii Akitoshi
分类号 H01G4/12;H01G4/30 主分类号 H01G4/12
代理机构 Arent Fox LLP 代理人 Arent Fox LLP
主权项 1. A multilayer ceramic electronic device comprising a lamination in which an internal electrode layer and a dielectric layer are laminated alternatively, wherein the dielectric layer is comprised of a dielectric ceramic composition including a main component represented by a general formula of ABO3 (A is at least one selected from Ba, Sr and Ca, and B is at least one selected from Ti, Zr and Hf) and a rare-earth component R (R is at least one selected from Sc, Y, La, Ce, Pr, Nd, Pm, Sm, Eu, Gd, Tb, Dy, Ho, Er, Tm, Yb and Lu), R segregation phases including the rare-earth component R are present in the dielectric layer, and when the dielectric layer is separated to six areas by dividing the dielectric layer sandwiched by a pair of the internal dielectric layers in the thickness direction, there are the R segregation phases present in two neighboring areas respectively adjacent to the pair of the internal electrode layers in the dielectric layer at a ratio of double or more compared with the R segregation phases present in two central areas located at a substantially center in the dielectric layer.
地址 Tokyo JP