| 摘要 |
PROBLEM TO BE SOLVED: To obtain an appropriate measurement result using a relatively simple configuration even when the position of a retroreflecting mirror is out of alignment.SOLUTION: A terahertz wave measurement device (100) comprises: generation means (110) for generating a terahertz wave (THz) upon irradiation by a laser beam (LB1); first adjustment means (170) for adjusting the path of the terahertz wave so that, while an object to be measured is not irradiated with a first terahertz wave (THz1) that is one portion of the terahertz wave, the object to be measured is irradiated with a second terahertz wave (THz2) that is the other portion of the terahertz wave; first detection means (130) for detecting the first and second terahertz waves upon irradiation by the laser beam (LB2); and second adjustment means (120) for adjusting the optical path length of the laser beam as the laser beam is retroreflected.SELECTED DRAWING: Figure 1 |
