发明名称 PALETTE-BASED SYSTEMS FOR ANALYTE CHARACTERIZATION
摘要 Systems, devices, and methods are provided that facilitate synthesis and analysis of chemical compounds on a convenient and automatable palette-based platform. Palettes utilized for analysis support a variety of functional sites, including test wells, separation devices, and test sites that have rapid thermal equilibration, on a single test fixture. This permits both the performance of a wide variety of tests and of tests with different temperature requirements or responses in parallel, on the same test fixture. Such systems, devices, and methods are particularly suitable for production and characterization of radiopharmaceuticals.
申请公布号 WO2016049571(A1) 申请公布日期 2016.03.31
申请号 WO2015US52448 申请日期 2015.09.25
申请人 TRACE-ABILITY, INC. 发明人 LEBEDEV, ARTEM Y;ELIZAROV, ARKADIJ M
分类号 G01N35/08;A61K51/00;B01D15/26;B01L3/00;G01N21/17;G01N23/04;G01N33/15 主分类号 G01N35/08
代理机构 代理人
主权项
地址
您可能感兴趣的专利