发明名称 MEMORY DEVICE AND METHOD FOR OPERATING THE SAME
摘要 According to an embodiment, an operation method for a memory device which has a first memory element and a second memory element respectively provided on both sides of a semiconductor member includes applying a first potential on the second word line to write a second data to the second memory and applying a second potential on the first word line to write the first data to the first memory. The first potential increases by a first step voltage and the second potential increases by a second step voltage.
申请公布号 US2016093382(A1) 申请公布日期 2016.03.31
申请号 US201514645708 申请日期 2015.03.12
申请人 Kabushiki Kaisha Toshiba 发明人 SAKAMOTO Wataru;ARAI Fumitaka;KATO Tatsuya
分类号 G11C16/10;G11C16/26 主分类号 G11C16/10
代理机构 代理人
主权项 1. An operation method for a memory device including: a first memory element provided on a side of a first plane of a semiconductor member, the first memory element having a first electrode and a first charge storage layer, the semiconductor member extending to a first direction, the first plane being along the first direction; a second memory element on a side of a second plane of the semiconductor member, the second memory element having a second electrode and a second charge storage layer, the second plane being opposed on the first plane with the semiconductor member; a first word line connected to the first electrode; and a second word line connected to the second electrode, the operation method comprising: when writing a first data to the first memory element, applying a first potential on the second word line to write a second data to the second memory, the first potential increasing by a first step voltage; and applying a second potential on the first word line to write the first data to the first memory, the second potential increasing by a second step voltage.
地址 Minato-ku JP