| 发明名称 |
IMAGING ELEMENT, IMAGING APPARATUS, AND SEMICONDUCTOR APPARATUS |
| 摘要 |
According to an embodiment, an imaging element includes a plurality of light receiving elements, a plurality of scanning circuits, a first line comprising a plurality of nodes, and a plurality of first variable resistance elements. The plurality of scanning circuits are respectively connected to the plurality of light receiving elements. Each of the plurality of first variable resistance elements is connected between the corresponding one of the nodes and a corresponding one of the scanning circuits. At least one of the first variable resistance elements includes a plurality of resistance elements connected to each other in parallel. |
| 申请公布号 |
US2016088243(A1) |
申请公布日期 |
2016.03.24 |
| 申请号 |
US201514847891 |
申请日期 |
2015.09.08 |
| 申请人 |
KABUSHIKI KAISHA TOSHIBA |
发明人 |
HIGASHI Yusuke;Marukame Takao;Suzuki Masamichi;Zaitsu Koichiro;Peng Haiyang;Noguchi Hiroki;Mitani Yuichiro |
| 分类号 |
H04N5/341;G11C13/00 |
主分类号 |
H04N5/341 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. An imaging element comprising:
a plurality of light receiving elements; a plurality of scanning circuits respectively connected to the plurality of light receiving elements; a first wiring line comprising a plurality of nodes; and a plurality of first variable resistance elements, each connected between a corresponding one of the nodes and a corresponding one of the scanning circuits, wherein at least one of the first variable resistance elements includes a plurality of resistance elements connected to each other in parallel. |
| 地址 |
Tokyo JP |
