发明名称 SEMICONDUCTOR DEVICE AND SEMICONDUCTOR DEVICE MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a structure and a manufacturing method of a storage device which can perform reset by using a reset gate and reduce cross sectional areas of a phase change film and a lower electrode in a direction in which a current flows.SOLUTION: A storage device comprises memory elements each including: a columnar insulator layer; a phase change film formed around an upper part of the columnar insulator layer; a lower electrode which is formed around a lower part of the columnar insulator layer and connected to the phase change film; a reset gate insulation film which surrounds the phase change film; and a reset gate which surrounds the reset gate insulation film. In the storage device, more than one row and more than one column of the storage elements are arranged, the reset gate is connected to the row direction and column direction, and the reset gate is a heater.SELECTED DRAWING: Figure 1
申请公布号 JP2016040843(A) 申请公布日期 2016.03.24
申请号 JP20150218563 申请日期 2015.11.06
申请人 UNISANTIS ELECTRONICS SINGAPORE PTE LTD 发明人 MASUOKA FUJIO;NAKAMURA HIROKI
分类号 H01L27/105;H01L29/423;H01L29/49;H01L45/00 主分类号 H01L27/105
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