发明名称 INTEGRATED CIRCUIT AND METHOD OF OPERATING AN INTEGRATED CIRCUIT
摘要 An integrated circuit comprises a first functional unit and one or more other functional units. The first functional unit has an input for receiving data and an output for providing data. The integrated circuit tests and operates the first functional unit. Testing comprises: connecting the input of the first functional unit to the output of the first functional unit, thereby generating a loopback path from the output of the first functional unit to the input of the first functional unit; loading a test pattern onto the first functional unit; feeding a test clock signal comprising one or more clock edges, thereby prompting the first functional unit to transform the test pattern; and reading the transformed test pattern. Operating the first functional unit comprises: connecting the input of the first functional unit to an output of the other functional units; and feeding a normal clock signal to the first functional unit.
申请公布号 US2016084903(A1) 申请公布日期 2016.03.24
申请号 US201414492633 申请日期 2014.09.22
申请人 MELAMED-KOHEN EYAL;COHEN ILAN;SDE-PAZ SHLOMI 发明人 MELAMED-KOHEN EYAL;COHEN ILAN;SDE-PAZ SHLOMI
分类号 G01R31/28;G01R31/317 主分类号 G01R31/28
代理机构 代理人
主权项 1. An integrated circuit comprising a first functional unit and one or more other functional units, wherein the first functional unit has an input for receiving data and an output for providing data, and wherein the integrated circuit is operable to test the first functional unit and operable to operate the first functional unit normally, and wherein testing the first functional unit comprises: connecting the input of the first functional unit to the output of the first functional unit, thereby generating a loopback path from the output of the first functional unit tothe input of the first functional unit; loading a test pattern onto the first functional unit; feeding a test clock signal comprising one or more clock edges to the first functional unit, thereby prompting the first functional unit to transform the test pattern; and reading the transformed test pattern from the first functional unit; and wherein operating the first functional unit normally comprises: connecting the input of the first functional unit to an output of the one or more other functional units;and feeding a normal clock signal to the first functional unit.
地址 MODIIN IL