发明名称 フォトマスク、それを用いたパターン形成方法及び露光装置
摘要 A photomask (101) comprises a translucent substrate (104) and a light-shielding film (102) which is formed on the translucent substrate (104) and has a light-shielding section (102a) and an opening (102b) forming a translucent region. A plurality of excavated parts (104a) is formed at an exposed region in the opening (102b) of the translucent substrate (104). The plurality of excavated parts (104a) is formed such that each width thereof becomes larger as the width is farther away from the focal point so that the light passing through the plurality of excavated parts (104a) is focused at a prescribed point.
申请公布号 JP5891406(B2) 申请公布日期 2016.03.23
申请号 JP20130511434 申请日期 2012.10.29
申请人 パナソニックIPマネジメント株式会社 发明人 三坂 章夫;笹子 勝
分类号 G03F1/38;G02B3/00;G03F1/50;G03F7/20 主分类号 G03F1/38
代理机构 代理人
主权项
地址