发明名称 THIN FILM TRANSISTOR ELEMENT MANUFACTURING METHOD, ORGANIC EL DISPLAY PANEL MANUFACTURING METHOD, ETCHING DEVICE AND WET ETCHING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a favorable manufacturing method of a thin film transistor having a wiring layer which is made mostly from copper and contains manganese.SOLUTION: A manufacturing method of a thin film transistor element 100 which includes on a substrate 101, a channel layer 104 which is made mostly from an oxide semiconductor and upper wiring layers 106s, 106d which are upper layers than the channel layer 104 and made mostly from copper comprises the steps of: forming an upper metal layer 106M in which a low resistance layer 106Mb made mostly from copper and a cap layer 106Mc made mostly from a manganese-containing copper alloy are laminated in this order; and performing wet etching on the upper metal layer 106M by using an etchant 113a with a manganese concentration controlled to be not less than 0 ppm and not more than 30 ppm to form upper wiring layers 106s, 106d.SELECTED DRAWING: Figure 12
申请公布号 JP2016039241(A) 申请公布日期 2016.03.22
申请号 JP20140161279 申请日期 2014.08.07
申请人 JOLED INC 发明人 AZUMA HIROSHI;NISHIDA KENICHIRO
分类号 H01L21/306;H01L21/308;H01L21/3205;H01L21/3213;H01L21/336;H01L21/768;H01L23/532;H01L29/786;H01L51/50 主分类号 H01L21/306
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