发明名称 |
SAMPLE CLEANING APPARATUS AND SAMPLE CLEANING METHOD |
摘要 |
The present invention provides an apparatus or a method for cleaning a sample, capable of suppressing yield reduction. The apparatus or method for cleaning a sample has: a means for ultrasonic-vibrating a sample laid and held on a sample holder disposed inside a treatment chamber; and a means for forming the flow of a gas in a direction along a surface of the sample inside the treatment chamber of an upper part of the sample, thereby discharging a particle separated from the surface of the sample by using the flow of the gas. The apparatus for cleaning a sample includes: a dielectric film placed on the sample holder and having the sample placed thereon; a first and a second electrode electrically insulated from each other inside the dielectric film and disposed adjacent to each other; and a high frequency power supply supplying high frequency power of a frequency in a certain range to the first and second electrodes with the sample held on the sample holder. |
申请公布号 |
KR20160031384(A) |
申请公布日期 |
2016.03.22 |
申请号 |
KR20150017370 |
申请日期 |
2015.02.04 |
申请人 |
HITACHI HIGH-TECHNOLOGIES CORPORATION |
发明人 |
KOFUJI NAOYUKI;KANEKIYO TADAMITSU;SHINODA KAZUNORI;TANAKA JUNICHI |
分类号 |
H01L21/02;H01L21/302 |
主分类号 |
H01L21/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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