发明名称 |
METHOD FOR MANUFACTURING OF A SEMICONDUCTOR DEVICE |
摘要 |
A method for manufacturing a semiconductor device comprises the following steps: forming active pins which are separated from one another in a first direction, protrude from a surface thereof, and are extended in the first direction, by etching a substrate; forming a device separation film pattern which partially fills a gap between the active pins on the substrate; forming a mold pattern including a first aperture part which exposes a part where the active pins are separated from one another, on the device separation film pattern; forming an insulation pattern filling the inside of the first aperture part; removing the mold pattern in order for the surface of the active pins to be exposed; and forming a gate structure extended in a second direction vertical to the first direction and a dummy gate structure extended in the second direction on the insulation pattern on each of the active pins. By the method for manufacturing the semiconductor device, a pin type transistor with excellent characteristics can be manufactured. |
申请公布号 |
KR20160030794(A) |
申请公布日期 |
2016.03.21 |
申请号 |
KR20140120432 |
申请日期 |
2014.09.11 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KIM, SUNG MIN;KIM, CHEOL;CHA, DONG HO |
分类号 |
H01L21/336;H01L29/78 |
主分类号 |
H01L21/336 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|