发明名称 |
NONVOLATILE SEMICONDUCTOR MEMORY DEVICE AND METHOD OF MANUFACTURING THE SAME |
摘要 |
This nonvolatile semiconductor memory device includes a semiconductor substrate and a first semiconductor layer formed on a surface of the semiconductor substrate. A memory cell array is formed by coupling a plurality of memory cells in series, and includes a memory string formed to extend in a first direction vertical to the surface of the semiconductor substrate. A contact extends in a direction vertical to the semiconductor substrate, and has one end coupled to the first semiconductor layer. The contact includes: a second semiconductor layer that is formed in the first semiconductor layer and has a higher impurity concentration than that of the first semiconductor layer; a silicide film that has one end coupled to the second semiconductor layer and extends in the first direction; and a metal film formed on an inner wall of the silicide film. |
申请公布号 |
US2016079265(A1) |
申请公布日期 |
2016.03.17 |
申请号 |
US201514645874 |
申请日期 |
2015.03.12 |
申请人 |
Kabushiki Kaisha Toshiba |
发明人 |
AKUTSU Yoshihiro;Meguro Hisataka |
分类号 |
H01L27/115;H01L21/768;H01L21/285;H01L23/532 |
主分类号 |
H01L27/115 |
代理机构 |
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代理人 |
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主权项 |
1. A nonvolatile semiconductor memory device, comprising:
a semiconductor substrate; a first semiconductor layer formed on a surface of the semiconductor substrate; a memory cell array that includes a memory string formed to extend in a first direction vertical to the surface of the semiconductor substrate, the memory string being formed by coupling a plurality of memory cells in series; a contact that extends in the first direction, the contact having one end coupled to the first semiconductor layer, wherein the contact includes:
a second semiconductor layer formed in the first semiconductor layer, the second semiconductor layer having a higher impurity concentration than an impurity concentration of the first semiconductor layer;a silicide film that has one end coupled to the second semiconductor layer, the silicide film extending in the first direction; anda metal film formed on an inner wall of the silicide film. |
地址 |
Minato-ku JP |