发明名称 |
Selective Sampling of Data Stored in Nonvolatile Memory |
摘要 |
Data stored in a nonvolatile memory is selectively sampled based on write-erase cycle counts of blocks. Blocks with the lowest write-erase cycle counts are sampled to determine an error rate which is compared with a limit. If the error rate exceeds the limit then the sample is expanded to include blocks with the next lowest write-erase cycle counts. |
申请公布号 |
US2016077903(A1) |
申请公布日期 |
2016.03.17 |
申请号 |
US201414483915 |
申请日期 |
2014.09.11 |
申请人 |
SanDisk Technologies Inc. |
发明人 |
Reddy Gautham Kumar;Yang Niles;Bauche Alexandra |
分类号 |
G06F11/07;G06F11/10;G11C16/16 |
主分类号 |
G06F11/07 |
代理机构 |
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代理人 |
|
主权项 |
1. A method of identifying high error rate data in a block-erasable nonvolatile memory comprising:
(a) maintaining individual write-erase cycle counts for a plurality of blocks of the nonvolatile memory; (b) selecting a first subset of the plurality of blocks for error rate sampling, the first subset consisting of blocks with the lowest write-erase cycle counts of the plurality of blocks; (c) sampling data stored in the first subset of the plurality of blocks to estimate a first error rate for the first subset of the plurality of blocks; (d) comparing the first error rate with a first limit; (e) in response to determining that the first error rate exceeds the first limit, expanding the first subset to include additional blocks with next lowest write-erase cycle counts of the plurality of blocks; and (f) repeating steps (c)-(e). |
地址 |
Plano TX US |