发明名称 Circuit arrangement and method for testing same
摘要 The invention relates to a circuit arrangement and to a method for testing same. A circuit arrangement is provided that comprising a plurality of functional units which are coupled by at least one streaming data bus. Each of the functional units comprises a plurality of hardware modules and a switch matrix. At least one of the streaming data busses is provided with a data width of at least that of the widest hardware module of any of the functional units of the circuit arrangement. The switch matrices are configurable to establish a streaming data path between and through the plurality of functional units which is used as a test link for any of the hardware modules of the circuit arrangement. The invention provides for non-intrusive real-time tracing in SoCs with a minimum of additional hardware resources and at low cost in terms of die size and power consumption.
申请公布号 EP2557501(B1) 申请公布日期 2016.03.16
申请号 EP20110177200 申请日期 2011.08.11
申请人 INTEL DEUTSCHLAND GMBH 发明人 MELZER, LARS;AUE, VOLKER
分类号 G06F11/267 主分类号 G06F11/267
代理机构 代理人
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