发明名称 |
Method and apparatus for floating or applying voltage to a well of an integrated circuit |
摘要 |
In one well bias arrangement, no well bias voltage is applied to the n-well, and no well bias voltage is applied to the p-well. Because no external well bias voltage is applied, the n-well and the p-well are floating, even during operation of the devices in the n-well and the p-well. In another well bias arrangement, the lowest available voltage is not applied to the p-well, such as a ground voltage, or the voltage applied to the n+-doped source region of the n-type transistor in the p-well. This occurs even during operation of the n-type transistor in the p-well. In yet another well bias arrangement, the highest available voltage is not applied to the n-well, such as a supply voltage, or the voltage applied to the p+-doped source region of the p-type transistor in the n-well. This occurs even during operation of the p-type transistor in the n-well. |
申请公布号 |
US9287253(B2) |
申请公布日期 |
2016.03.15 |
申请号 |
US201113374335 |
申请日期 |
2011.12.22 |
申请人 |
Synopsys, Inc. |
发明人 |
Moroz Victor;Kawa Jamil;Sproch James D.;Lefferts Robert B. |
分类号 |
H01L27/02;H01L21/8238;H01L27/092 |
主分类号 |
H01L27/02 |
代理机构 |
Haynes Beffel & Wolfeld LLP |
代理人 |
Suzue Kenta;Haynes Beffel & Wolfeld LLP |
主权项 |
1. An integrated circuit, comprising:
a semiconductor substrate; an n-well in the substrate having a range of n-well depths relative to a surface plane including a deepest n-well depth relative to the surface plane; a device in the n-well having at least one terminal with a range of n-well terminal depths relative to the surface plane including a deepest n-well terminal depth relative to the surface plane shallower, relative to the surface plane, than the deepest n-well depth relative to the surface plane; a p-well in the substrate having a range of p-well depths relative to the surface plane including a deepest p-well depth relative to the surface plane; a device in the p-well having at least one terminal with a range of p-well terminal depths relative to the surface plane including a deepest p-well terminal depth relative to the surface plane shallower, relative to the surface plane, than the deepest p-well depth relative to the surface plane; and biasing circuitry providing all bias voltages required by the device in the n-well and the device in the p-well for operation, wherein during operation of the device in the n-well and the device in the p-well: (i) the biasing circuitry applies a bias voltage arrangement to the device in the n-well and the device in the p-well, (ii) no well bias voltage is applied by the biasing circuitry to the n-well, and (iii) no well bias voltage is applied by the biasing circuitry to the p-well, wherein the n-well and the p-well are physically connected directly to each other along a range of shared well depths from the surface plane to an intermediate plane in the substrate deeper than the surface plane. |
地址 |
Mountain View CA US |