发明名称 |
Three-dimensional structures and related methods of forming three-dimensional structures |
摘要 |
The present disclosure provides three-dimensional structures and related methods. The three-dimensional structures may define patterns of positive and negative spaces on opposing surfaces that combine to form the three-dimensional structures. The negative spaces of the patterns may intersect to form apertures through the three-dimensional structures, which may define linear or non-linear paths therethrough. The apertures may be configured to provide desirable characteristics with respect to light, sound, and fluid travel therethrough. Further, the three-dimensional structures may be configured to define desired stiffness, weight, and/or flexibility. The three-dimensional structures may be employed in embodiments including heat sinks, housings, speaker or vent covers, springs, etc. |
申请公布号 |
US9283642(B2) |
申请公布日期 |
2016.03.15 |
申请号 |
US201213355437 |
申请日期 |
2012.01.20 |
申请人 |
Apple Inc. |
发明人 |
Andre Bartley K.;Rohrbach Matthew D.;Russell-Clarke Peter N. |
分类号 |
B23P13/00;B23K26/38;B29C67/00;B44C1/22;H05K5/02;B23K26/36 |
主分类号 |
B23P13/00 |
代理机构 |
Downey Brand LLP |
代理人 |
Downey Brand LLP |
主权项 |
1. A three-dimensional structure for a housing of an electronic device, the three-dimensional structure comprising:
a unitary body comprising: a first surface comprising a first pattern of a positive space defined by a first non-random pattern of a negative space that extends into the body a first defined depth in accordance with a first axis, and a second surface at a different position on the body from the first surface and comprising a second pattern of a positive space defined by a second non-random pattern of a negative space that extends into the body a second depth and in accordance with a second axis, wherein at least some of the first non-random pattern of negative space and the second non-random pattern of negative space overlap with each other forming apertures that extend through the unitary body having a size and a shape in accordance with an amount of overlap, wherein the first and second positive spaces combine to form a positive surface of the three dimensional structure. |
地址 |
Cupertino CA US |