Test probe alignment structures for radio-frequency test systems

摘要

Electronic devices may be tested using a test station with a test fixture. The test fixture may include a first holding structure in which a device under test may be placed and a second holding structure for supporting test probes. The second holding structure may be mated with a test probe alignment structure during test station setup operations. The test probe alignment structure may include registration features configured to set the relative position of the first and second holding structures to a known configuration and may include test probe alignment features that can be used to correctly position the placement of the test probes. If at least one of the test probes is not sufficiently aligned to its corresponding alignment feature, the test probe alignment structures will not be able to engage properly with the second holding structure, and the position of the problematic test probe may be adjusted accordingly.

主权项

1. A method for configuring at least one test probe that is located at an adjustable position within a test fixture in a radio-frequency test station, comprising:
placing a test probe alignment structure into alignment with the test fixture; and while the test probe alignment structure and the test fixture are aligned, adjusting the position of the test probe with respect to the test fixture and the test probe alignment structure so that the test probe aligns with at least one corresponding test probe alignment feature in the test probe alignment structure, wherein adjusting the position of the test probe with respect to the test fixture and the test probe alignment structure so that the test probe aligns with at least one corresponding test probe alignment feature in the test probe alignment structure comprises moving the test probe horizontally within a test probe adjustment region, with respect to the test fixture and the test probe alignment structure, so that the test probe protrudes vertically into the at least one corresponding test probe alignment feature in the test probe alignment structure.