| 摘要 |
The present invention relates to a three-dimensional shape measurement method capable of more accurately measuring a three-dimensional shape by irradiating a line pattern light to an object to be measured; analyzing a line profile of the line pattern light reflected from a surface of the object to be measured to primarily calculate a difference value of the surface of the object to be measured; and then irradiating a lattice pattern light with a cycle corresponding to the difference value to calculate a height value of the object to be measured. According to the present invention, the three-dimensional shape measurement method comprises: a first step of allowing a pattern light generation unit to irradiate a line pattern light to an object to be measured using a line pattern image provided from a shape measurement terminal; a second step of allowing a photographing unit to photograph the object to be measured to which the line pattern light is irradiated; a third step of allowing a shape measurement terminal to detect a line pattern image from the photographed image received from the photographing unit, and to calculate a line light difference value of the object to be measured based on the detected line profile; a fourth step of selecting a lattice pattern image with a cycle characteristic corresponding to the line light difference value from the shape measurement terminal, and then providing the lattice pattern image to the pattern light generation unit; a fifth step of allowing the pattern light generation unit to irradiate a predetermined cycle of the lattice pattern light to the object to be measured using the lattice pattern image; a sixth step of allowing the photographing unit to photograph the object to be measured to which the lattice pattern light is irradiated; and a seventh step of allowing the shape measurement terminal to detect the lattice pattern light from the photographed image provided from the photographing unit, to calculate a phase value from the detected lattice pattern light, and then to calculate a height value corresponding to the calculated phase value. |
