| 摘要 |
The present invention is to provide a semiconductor apparatus capable of preventing area increase caused by signal lines used in a test. The semiconductor apparatus of the present invention comprises: a first normal circuit for generating a normal signal during a normal operation; a test signal generation unit for generating a test signal in response to a test control signal; a signal transmission unit for transmitting the normal signal or the test signal to a signal line as an internal signal; a second normal circuit for executing a normal operation in response to the internal signal transmitted from the signal line; and a test operation circuit for executing a test operation in response to the internal signal transmitted from the signal line. |
