发明名称 |
Silicon-germanium light-emitting element |
摘要 |
Provided is an element structure whereby it is possible to produce a silicon-germanium light-emitting element enclosing an injected carrier within a light-emitting region. Also provided is a method of manufacturing the structure. Between the light-emitting region and an electrode there is produced a narrow passage for the carrier, specifically, a one-dimensional or two-dimensional quantum confinement region. A band gap opens up in this section due to the quantum confinement, thereby forming an energy barrier for both electrons and positive holes, and affording an effect analogous to a double hetero structure in an ordinary Group III-V semiconductor laser. Because no chemical elements other than those used in ordinary silicon processes are employed, the element can be manufactured inexpensively, simply by controlling the shape of the element. |
申请公布号 |
US9287456(B2) |
申请公布日期 |
2016.03.15 |
申请号 |
US201214127837 |
申请日期 |
2012.06.12 |
申请人 |
HITACHI, LTD. |
发明人 |
Suwa Yuji;Saito Shinichi;Nomoto Etsuko;Takahashi Makoto |
分类号 |
H01L33/06;H01L33/34;H01L33/36;H01L33/00;H01S5/32;H01L33/20;H01S5/042;H01S5/10 |
主分类号 |
H01L33/06 |
代理机构 |
Mattingly & Malur, PC |
代理人 |
Mattingly & Malur, PC |
主权项 |
1. A light-emitting element comprising:
an insulating layer provided on a semiconductor substrate; a first electrode for implanting electrons and a second electrode for implanting holes, the first and second electrodes being provided on the insulating layer; and a light-emitting portion electrically connected to the first and second electrodes and composed of a thin film extending in parallel with a surface of the semiconductor substrate on the insulating layer, wherein the thin film is composed of either a silicon crystal or a germanium crystal and has such a film thickness that light is emitted by implantation of the electrons and holes, wherein the thin film includes two regions in which holes are disposed at a predetermined interval in a longitudinal direction in vicinities of the first and second electrodes, respectively, and wherein a gap between adjacent holes of the two regions in which holes are disposed is equal to or less than 10 nm. |
地址 |
Tokyo JP |