发明名称 |
SEMICONDUCTOR DEVICE, DRIVER IC, DISPLAY DEVICE, AND ELECTRONIC DEVICE |
摘要 |
A semiconductor device including a test circuit is miniaturized. The semiconductor device includes r first input terminals (r is an integer of 2 or more), a second input terminal, r functional circuits, a demultiplexer, and a switch circuit. The demultiplexer is a pass transistor logic circuit. R output terminals of the demultiplexer are electrically connected to respective input terminals of the functional circuits and the input terminal is electrically connected to the second input terminal. Input terminals of the r functional circuits are electrically connected to the respective first input terminals through the switch circuit. For example, a signal for verification is input to the second input terminal in verification of the functional circuits to operate the demultiplexer. One signal for verification is input to r functional circuits by the demultiplexer. |
申请公布号 |
WO2016034984(A1) |
申请公布日期 |
2016.03.10 |
申请号 |
WO2015IB56418 |
申请日期 |
2015.08.25 |
申请人 |
SEMICONDUCTOR ENERGY LABORATORY CO., LTD. |
发明人 |
TAKAHASHI, KEI;KOBAYASHI, HIDETOMO |
分类号 |
H03K17/693;G09G3/20;G09G3/30;H01L51/50;H05B33/14 |
主分类号 |
H03K17/693 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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