发明名称 |
CONTACT PRESSURE MEASURING APPARATUS, METHOD OF MANUFACTURING THE SAME AND METHOD OF MEASURING CONTACT PRESSURE |
摘要 |
An apparatus and method for measuring a contact pressure and a method of manufacturing the apparatus. The apparatus includes: a material layer configured to provide a light path along which incident light travels to a subject being in contact with the material layer; a spectrum analyzer configured to detect light emitted from the material layer and perform a light absorption spectrum analysis on the detected light to determine an intensity of the detected light; and a pressure calculator configured to determine the contact pressure of the subject based on the determined intensity. |
申请公布号 |
US2016069756(A1) |
申请公布日期 |
2016.03.10 |
申请号 |
US201514820653 |
申请日期 |
2015.08.07 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KIM Sangkyu;LEE Joonhyung;CHO Seongho |
分类号 |
G01L1/24;G01N21/31;G01M11/00 |
主分类号 |
G01L1/24 |
代理机构 |
|
代理人 |
|
主权项 |
1. An apparatus for measuring a contact pressure, the apparatus comprising:
a material layer configured to provide a light path along which incident light travels to a subject being in contact with the material layer; a spectrum analyzer configured to detect light emitted from the material layer and perform a light absorption spectrum analysis on the detected light to determine an intensity of the detected light; and a pressure calculator configured to determine a contact pressure of the subject based on the determined intensity. |
地址 |
Suwon-si KR |