METHOD FOR MONITORING DEFECT IN POLAROID FILMS

摘要

The present invention relates to a defect monitoring method for a polaroid film. The defect monitoring method for a polaroid film comprises: (S1) a step of selecting an area in which a stain exists by photographing a transferred polaroid film; (S2) a step of obtaining a brightness intensity by measuring a brightness difference between a stain area and a reference area; (S3) a step of converting the brightness intensity of each stain into a percentage; and (S4) a step of selecting a stain representative value (G) among the brightness intensity wherein the percentage thereof is 65-100, and determining that a defect is generated when the stain representative value (G) exceeds a defect reference value. As such, the defect monitoring method for a polaroid film improves uniformity of a product by digitizing the defect, and remarkably improves production efficiency by enabling the defect to be estimated in a production line.