发明名称 |
Semiconductor devices and methods of fabricating the same |
摘要 |
A semiconductor device includes a plurality of gate structures on a substrate, the plurality of gate structures including a gate metal pattern and delimiting air gaps formed therebetween, an insulating layer on the plurality of gate structures, and a porous insulating layer between the plurality of gate structures and the insulating layer, the porous insulating layer configured to cross the plurality of gate structures to delimit the air gaps. |
申请公布号 |
US9281361(B2) |
申请公布日期 |
2016.03.08 |
申请号 |
US201314028912 |
申请日期 |
2013.09.17 |
申请人 |
Samsung Electronics Co., Ltd. |
发明人 |
Choi Jongwan;Lee Bo-Young;Lee Myoungbum |
分类号 |
H01L29/06;H01L21/764;H01L27/115 |
主分类号 |
H01L29/06 |
代理机构 |
Harness, Dickey, & Pierce, P.L.C. |
代理人 |
Harness, Dickey, & Pierce, P.L.C. |
主权项 |
1. A semiconductor device, comprising:
cell gate structures on a substrate, the cell gate structures having first air gaps therebetween; peripheral gate structures on the substrate, the peripheral structures having second air gaps therebetween; an insulating layer on the cell gate structures and the peripheral gate structures, the insulating layer configured to cover sidewalls of the peripheral gate structures and the second air gaps; and a porous insulating layer between the cell gate structures and the insulating layer, the porous insulating layer configured to cross the cell gate structures to delimit the first air gaps, wherein a bottom surface of a portion of the porous insulating layer delimiting the first air gaps is located below a portion of the insulating layer covering an upper portion of the second air gaps. |
地址 |
Gyeonggi-do KR |