发明名称 Semiconductor memory device capable of preventing negative bias temperature instability (NBTI) using self refresh information
摘要 A semiconductor memory device that includes a command decoder, a refresh controller, an oscillator and a delay unit. The command decoder generates a self refresh command, and the oscillator generates an oscillation signal. The refresh controller generates a refresh control signal and a recovery signal in response to the self refresh command and the oscillation signal. The delay unit transitions internal nodes included in the delay unit that are not transitioned during a refresh period in response to the refresh control signal and the recovery signal.
申请公布号 US9281048(B2) 申请公布日期 2016.03.08
申请号 US201414325852 申请日期 2014.07.08
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 Kim Byung-Chul;Kim Yang-Ki;Jeon Seong-Hwan
分类号 G11C7/00;G11C11/406;G11C11/4076;G11C11/4067;G11C7/04 主分类号 G11C7/00
代理机构 F. Chau & Associates, LLC 代理人 F. Chau & Associates, LLC
主权项 1. A semiconductor memory device, comprising: a command decoder configured to generate a self refresh command; an oscillator configured to generate an oscillation signal; a refresh controller configured to generate a refresh control signal and a recovery signal in response to the self refresh command and the oscillation signal; and a delay unit configured to transition voltage levels of internal nodes included in the delay unit during a refresh period, in response to the refresh control signal and the recovery signal.
地址 Suwon-Si, Gyeonggi-Do KR