发明名称 |
Semiconductor memory device capable of preventing negative bias temperature instability (NBTI) using self refresh information |
摘要 |
A semiconductor memory device that includes a command decoder, a refresh controller, an oscillator and a delay unit. The command decoder generates a self refresh command, and the oscillator generates an oscillation signal. The refresh controller generates a refresh control signal and a recovery signal in response to the self refresh command and the oscillation signal. The delay unit transitions internal nodes included in the delay unit that are not transitioned during a refresh period in response to the refresh control signal and the recovery signal. |
申请公布号 |
US9281048(B2) |
申请公布日期 |
2016.03.08 |
申请号 |
US201414325852 |
申请日期 |
2014.07.08 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
Kim Byung-Chul;Kim Yang-Ki;Jeon Seong-Hwan |
分类号 |
G11C7/00;G11C11/406;G11C11/4076;G11C11/4067;G11C7/04 |
主分类号 |
G11C7/00 |
代理机构 |
F. Chau & Associates, LLC |
代理人 |
F. Chau & Associates, LLC |
主权项 |
1. A semiconductor memory device, comprising:
a command decoder configured to generate a self refresh command; an oscillator configured to generate an oscillation signal; a refresh controller configured to generate a refresh control signal and a recovery signal in response to the self refresh command and the oscillation signal; and a delay unit configured to transition voltage levels of internal nodes included in the delay unit during a refresh period, in response to the refresh control signal and the recovery signal. |
地址 |
Suwon-Si, Gyeonggi-Do KR |