| 摘要 |
The invention aims to provide a silk screen printing device which can accurately analyze reasons of poor printing position offset and suitably make measures, and an analyzing device and analyzing method for analyzing silk screen poor printing. A sign identifying device identifies the position reference sign of a specific monolithic substrate as an alignment reference; based on the identification results, a carrier and a screen mask are aligned and are printed; the soldering position offset state of each monolithic substrate is detected, and in the measurement results, if the specific monolithic substrate is detected to have position offset, the information caused by poor alignment of the carrier is outputted as an analyzing result, if the monolithic substrate except the specific monolithic substrate is detected to have position offset, the information caused by poor alignment of the monolithic substrate to the carrier is outputted as an analyzing result, and if the fluctuation scope of the position offset of a same monolithic substrate exceeds an allowable scope, the information caused by the stretching of the monolithic substrate is outputted as an analyzing result. |
