发明名称 レジスト組成物及びレジストパターン形成方法
摘要 A resist composition which generates a base upon exposure and exhibits increased solubility in an alkali developing solution under the action of acid, and the resist composition including: a base component (A) that exhibits increased solubility in an alkali developing solution under the action of acid; an acidic compound component (G1) including a nitrogen-containing cation having a pKa value of 7 or less and a counteranion; and a buffer component (K) including a nitrogen-containing cation and a counteranion being a conjugate base for the acid having a pKa value of 0 to 5.
申请公布号 JP5879209(B2) 申请公布日期 2016.03.08
申请号 JP20120139756 申请日期 2012.06.21
申请人 東京応化工業株式会社 发明人 中村 剛;横谷 次朗;仁藤 豪人;清水 宏明
分类号 G03F7/004;G03F7/038;G03F7/039 主分类号 G03F7/004
代理机构 代理人
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