发明名称 NITRIDE SEMICONDUCTOR WAFER AND METHOD FOR MANUFACTURING THE SAME
摘要 PROBLEM TO BE SOLVED: To provide a nitride semiconductor wafer which is thin in its growth film thickness and superior in productivity, and which allows a light-emitting device having a satisfactory light-emitting property to be obtained.SOLUTION: A nitride semiconductor wafer comprises: a nitride semiconductor template having a nitride semiconductor layer as its uppermost layer: and a light-emitting layer of a multiple quantum well structure, which is composed of a re-grown nitride semiconductor and a p-type nitride semiconductor layer which are stacked on the nitride semiconductor template. When of well layers in the light-emitting layer of the multiple quantum well structure, the well layer closest to the p-type nitride semiconductor layer is referred to as "top well layer", the distance t from a re-growth interface of the nitride semiconductor layer of the nitride semiconductor template to the top well layer is 1 μm or less; the oxygen density in the top well layer is 5.0×10cmor less.SELECTED DRAWING: Figure 1
申请公布号 JP2016032038(A) 申请公布日期 2016.03.07
申请号 JP20140154058 申请日期 2014.07.29
申请人 SUMITOMO CHEMICAL CO LTD 发明人 FUJIKURA HAJIME
分类号 H01L33/32;H01L33/06 主分类号 H01L33/32
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