| 摘要 |
PROBLEM TO BE SOLVED: To provide a high-precision defective pixel detection system in which temperature unevenness occurring within a sensor plane when the temperature of a sensor increases is set to a one-dimensional temperature distribution by driving means of the sensor, whereby a detection error caused by the temperature unevenness can be reduced without requiring any temperature adjusting facilities such as a constant temperature bath or the like and any temperature distribution measuring unit such as a thermography or the like.SOLUTION: A defective pixel detection system for an imaging element that is capable of detecting defective pixel information of a solid-state image pickup device has: a solid-state image pickup device including a plurality of pixels; an image pickup device driving unit comprising first driving means, and second driving means capable of intercepting power supply of a part of a driving circuit operating during a normal imaging operation of the solid-state image pickup device and operating under this state in the driving circuit; temperature detecting means for detecting the temperature of the solid-state image pickup device; and correction means for correcting a defective pixel detection threshold value according to the temperature detected by the temperature detecting means.SELECTED DRAWING: Figure 4 |
