发明名称 FRONT SIDE PACKAGE-LEVEL SERIALIZATION FOR PACKAGES COMPRISING UNIQUE IDENTIFIERS
摘要 A method of making a semiconductor device can include providing a plurality of semiconductor die, wherein each semiconductor die comprises an active surface and a backside opposite the active surface. The method can include forming a build-up interconnect structure that extends over the active surface of each of the plurality of semiconductor die within the wafer, and forming a unique identifying mark for each of the plurality of semiconductor die as part of a layer within the build-up interconnect structure while simultaneously forming the layer of the build-up interconnect structure. The layer of the build-up interconnect structure can comprise both the unique identifying marks for each of the plurality of semiconductor die and functionality for the semiconductor device. Each unique identifying mark can convey a unique identity of its respective semiconductor die. The method can further include singulating the plurality of semiconductor die into a plurality of semiconductor devices.
申请公布号 US2016064334(A1) 申请公布日期 2016.03.03
申请号 US201514836525 申请日期 2015.08.26
申请人 DECA Technologies Inc. 发明人 Bishop Craig;Daniel Sabbas A.;Scanlan Christopher M.
分类号 H01L23/544;H01L21/66;H01L21/56;H01L21/768;H01L21/78 主分类号 H01L23/544
代理机构 代理人
主权项 1. A method of making a semiconductor device, comprising: providing a plurality of semiconductor die, wherein each semiconductor die comprises an active surface and a backside opposite the active surface; forming a build-up interconnect structure that extends over the active surface of each of the plurality of semiconductor die within the wafer; forming a unique identifying mark for each of the plurality of semiconductor die as part of a layer within the build-up interconnect structure while simultaneously forming the layer of the build-up interconnect structure, wherein the layer of the build-up interconnect structure comprises both the unique identifying marks for each of the plurality of semiconductor die and functionality for the semiconductor device, wherein each unique identifying mark conveys a unique identity of its respective semiconductor die; and singulating the plurality of semiconductor die into a plurality of semiconductor devices.
地址 Tempe AZ US