发明名称 INTERPOSER STRUCTURE AND MANUFACTURING METHOD THEREOF
摘要 The present disclosure relates to an interposer structure and a manufacturing method thereof. The interposer structure includes a first dielectric layer, a conductive pad, and a bump. The conductive pad is disposed in the first dielectric layer, wherein a top surface of the conductive pad is exposed from a first surface of the first dielectric layer, the conductive pad further includes a plurality of connection feet, and the connection feet protrude from a bottom surface of the conductive pad to a second surface of the first dielectric layer. The bump is disposed on the second surface of the first dielectric layer, and the bump directly contacts to the connection feet. Through the aforementioned interposer structure, it is sufficient to achieve the purpose of improving the electrical performance of the semiconductor device and avoiding the signal being loss through the TSV.
申请公布号 US2016064314(A1) 申请公布日期 2016.03.03
申请号 US201414468329 申请日期 2014.08.26
申请人 UNITED MICROELECTRONICS CORP. 发明人 Lin Ming-Tse;Wu Kuei-Sheng;Kuo Chien-Li
分类号 H01L23/498;H01L21/311;H01L21/48 主分类号 H01L23/498
代理机构 代理人
主权项 1. An interposer structure, comprising: a first dielectric layer, comprising a first surface and a second surface opposite to the first surface; a conductive pad disposed in the first dielectric layer, wherein a top surface of the conductive pad is exposed from the first surface of the first dielectric layer, the conductive pad further comprises a plurality of connection feet, and the connection feet protrude from a bottom surface of the conductive pad to the second surface of the first dielectric layer; a bump, disposed on the second surface of the first dielectric layer, the bump directly contacting to the connection feet.
地址 Hsin-Chu City TW