发明名称 LEE METRIC ERROR CORRECTING CODE
摘要 A memory device may include memory components for storing data. The memory device may also include a controller that determines whether one or more errors exist in a data packet stored in the memory components. The controller may read a code word associated with the data packet, such that the code word may be used to indicate whether the errors exist in the data packet. The controller may then determine a syndrome polynomial based on the code word and determine an inverse of the syndrome polynomial when the syndrome polynomial is not zero. The controller may then determine a first error locator polynomial and a second error locator polynomial based on the inverse of the syndrome polynomial. The first error locator polynomial and the second error locator polynomial may be used to identify one or more locations of one or more errors in the code word.
申请公布号 US2016062826(A1) 申请公布日期 2016.03.03
申请号 US201414475198 申请日期 2014.09.02
申请人 Micron Technology, Inc. 发明人 Varanasi Chandra C.
分类号 G06F11/10;H03M13/15;H03M13/19 主分类号 G06F11/10
代理机构 代理人
主权项 1. A method, comprising: receiving a data packet configured to be encoded; receiving a finite field size associated with encoding the data packet; generating a normalized primitive Generalized Reed Solomon (GRS) code based on the data packet and the finite field size; determining a generator matrix based on the normalized primitive GRS code; generating a code word based on the generator matrix, wherein the code word comprises the data packet and is configured to determine whether the data packet is stored in a memory includes any errors; and storing the data packet having the code word in the memory.
地址 Boise ID US